Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle

Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°

Random angle

0 to 360°

X/Y axis: 20 µm, Z axis: 2 µm

X/Y axis: 50 µm, Z axis: 5 µm

Magnification: 4x, Resolution: 2.5 µm

Magnification: 10x, Resolution: 1 µm

X/Y axis: 0.2 nm, Z axis: 0.05 nm

Ø≤ 90 mm, H≤ 20 mm

0 to 20 mm

10 ± 2 ms

0.6 Hz to 4.34 Hz

XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously

256×256, 512×512

DSP digital feedback

64 KHz

USB 2.0

Compatible with windows 98/2000/XP/7/8

415 × 410 × 545 mm

700 × 500 × 460 mm

40 kg

50 kg

87.4 kg

Atomic force microscope

Atomic force microscope 43-ATM100